Scanning Electron Microscopes

Scanning Electron Microscopy (SEM) is a powerful imaging technique that uses a focused beam of electrons to obtain high-resolution images of the surface of a sample. It provides detailed information about the sample's topography, morphology, and elemental composition, making it an invaluable tool in fields such as materials science, nanotechnology, biology, and forensic analysis.

Jeol JSM-IT800HL
Capacity: 1 persons
Status: Available
Tescan Mira3
Capacity: 1 persons
Status: Available
Phenom-World Phenom Pure G5 Tabletop SEM - VMT1
Capacity: 1 persons
Status: Available