The JEOL JEM-2800 is a high throughput nano-analysis TEM with automated functions. This versatile TEM features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS for chemical analysis; TEM and STEM tomography; and in situ observation of samples. The instrument is operated without a fluorescent screen and the operator sits in a bright room.

• Emitter: Schottky FEG
• Installation year: 2016
• Resolution: 0.1 nm (TEM lattice), 0.2 nm (TEM point), 0.14 nm (STEM)
• Acceleration voltage:100 kV, 200 kV
• Camera: JEOL 2K x 2K CMOS camera
• Spot size: 0.2 - 2 nm
• Objective lens: C_s 0.7 mm, C_c 1.3 mm
• Analytical: High-speed EDX, 100 m2, 0.95 sr, 133 eV
• Energy filter: No
• Cryo: Liquid nitrogen cooled cryogenic sample holder.