X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystal structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy.

Bruker Microstar Small-angle X-Ray Scattering (SAXS)
Status: Available
Bruker Microstar Wide-angle X-ray scattering (WAXS)
Status: Unavailable
Rigaku SmartLab X-ray diffractometer (XRD)
Status: Available