XRD can be used to determine the atomic and molecular structure of a crystalline materials.

BE AWARE! Currently (9.9.2021) the diffractometer needs to be operated at decreased power (45kV/150mA) due to cooling issues.j

• Rotating anode x-ray source (9 kW, Cu Kα,β)
• Optics can be changed easily between Bragg-Brentano, parallel beam and Ge (220) × 2 double-bounce monochromator (with or without soller slits), collimator setup, and a focussing optics
• 2D single photon counting pixel detector HyPix-3000 (77.5 × 38.5 mm, pixel size 100 μm × 100 μm)
• Automatic optics and sample alignment
• Eulerian cradle geometry where the sample can be kept horizontal while source and detector move
• Several different sample stages (rotation (Rx,Ry), translation (x,y), standard)
• Techniques covered by the instrument:
  • powder diffraction
  • x-ray reflectivity (XRR), thin film XRD
  • pole figure analysis
  • reciprocal space mapping
  • grazing-incidence XRD/SAXS at medium angles
  • single fibre measurements in transmission (with focussing CBO-f optics), orientation analysis
  • SAXS at medium angles in transmission
  • in-plane XRD measurements
  • residual stress analysis
  • XRD on liquid surfaces
• Linkam heating/cooling stage HFSX-350-GI and a modified HFS600 for in situ XRD and grazing incidence XRD measurements (-196 °C to 600 °C) in air and nitrogen atmospheres