Scanning electron microscope (SEM) configured for lithography purposes (currents up to 100 nA). Imaging possible down to 10-50 nm resolution. Thermal FEG emitter.
User manuals in the clean room and on the SEM pc's. Manufacturer's website for the model: https://www.jeolbenelux.com/JEOL-BV-News/jsm-7100f-thermal-field-emission-electron-microscope
Please select an infrastructure: