Ascanning electron microscope(SEM) is a type ofelectron microscopethat produces images of a sample by scanning the surface with a focused beam ofelectrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surfacetopographyand composition. The electron beam is scanned in araster scanpattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer.

Environmental SEM (Zeiss Evo HD15)
Status: Available
Analytical high-resolution SEM (JEOL JSM-7500FA)
Status: Available
Entry-level SEM (Zeiss Sigma VP)
Status: Available