A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. The electron beam is scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer.
| Zeiss Evo HD15 Environmental SEM - NMC |
Status: Unavailable |
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| JEOL JIB-4700F - NMC |
Status: Available |
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| JEOL JSM-7500FA (Analytical high-resolution SEM) - NMC |
Status: Available |
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| Zeiss Sigma VP (Entry-level SEM) - NMC |
Status: Unavailable |
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