Transmission Electron Microscopes

Transmission electron microscopy TEM, also sometimes conventional transmission electron microscopy or CTEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a charge-coupled device.

FEI Tecnai 12 (120 kV TEM) - NMC
Status: Available
JEOL JEM-2200FS (Cs-corrected HR-TEM) - NMC
Status: Available
JEOL JEM-2800 (Analytical HR-TEM) - NMC
Status: Available
JEOL JEM-3200FSC (Liquid helium cryo-TEM) - NMC
Status: Available
FEI Tecnai F20 (200 kV TEM) - NMC
Status: Unavailable
Nonexistent microscope for testing bookings - NMC
Status: Available