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Department of Applied Physics
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Thin Film Characterization
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Department of Applied Physics
Thin Film Characterization
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Key facts
Status
Unavailable
Location
Puumiehenkuja 2
Room
118
Is training required?
Yes
Minimum reservation length
1 h
Contact information
Name
Email
Ali Afzalifar
ali.afzalifar@aalto.fi
Device information
Manufacturer
J.A. Woollam
Model
M-2000UI
Image(s)
Host unit
Department of Applied Physics
Administrator contact info
Name
Email
Ali Afzalifar
ali.afzalifar@aalto.fi
Tags
ellipsometry
spectroscopy
Capacity
1 persons
Terms of use
Availability
Currently available only for SMW users. Other users can have access upon a request
Do reservations require approvals from administrators?
No
Does this resource contain technology under export control?
Not defined
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