The AFM can provide high-resolution images (subnanometric resolution) of any substrate both in air and in liquid media. The sample is scanned by a sharp tip attached to a flexible cantilever whose deflection is monitored with an optical system consisting of a laser and a photodetector. Different scanning modes are available: contact mode, tapping mode, ScanAsyst. Besides topographical images, mechanical information of the sample (elastic modulus, deformation, dissipation, adhesion) can also be obtained using the PeakForce Quantitative NanoMechanics (PeakForce-QNM) mode. The AFM can also be applied for force measurements at nano/microscale (sensitivity in the order of picoNewtons).

NanoScope V controller.

• J scanner, maximum scan size 175 µm × 175 µm.
• E scanner, maximum scan size 15 µm × 15 µm.
• PicoForce scanner and controller, suitable for force measurements.
• Nikon objective and digital camera, for displaying optical video image in the computer.
• Heater, to control the temperature up to 60 °C.
• Probe holder for experiments in air and liquid cell for experiments in liquid.