AFM, Optical Microscopes, Sample Preparation, SEM
Atomic Force Microscopes (2 pcs)
Atomic Force Microscopy (AFM) is a high-resolution imaging technique used to study the surface topography and properties of materials at the nanoscale. It employs a sharp probe or cantilever with a nanoscale tip that interacts with the sample surface, and by monitoring the deflection of the cantilever, it provides detailed information about surface features, roughness, mechanical properties, and even molecular interactions, making it a valuable tool in nanotechnology, materials science, and biological research.
Optical Microscopes (8 pcs)
Optical microscopy is a widely used imaging technique that employs visible light or other forms of electromagnetic radiation to visualize and study samples at the microscopic level. It allows for the observation of a sample's structure, morphology, and features using lenses and illumination systems, making it an essential tool in various scientific disciplines, including biology, materials science, medicine, and quality control.
Sample Preparation (4 pcs)
Scanning Electron Microscopes (3 pcs)
Scanning Electron Microscopy (SEM) is a powerful imaging technique that uses a focused beam of electrons to obtain high-resolution images of the surface of a sample. It provides detailed information about the sample's topography, morphology, and elemental composition, making it an invaluable tool in fields such as materials science, nanotechnology, biology, and forensic analysis.