X-ray diffraction (XRD) is a sophisticated analytical technique used for determining the crystal structure of materials. This technique is based on the interaction of X-rays with matter, with the X-rays scattering in a pattern that can be used to determine the structure of the material. XRD is widely used in materials science, chemistry, and physics for determining crystalline structure of materials including metals, minerals, and pharmaceuticals. Select

X-ray fluorescence (XRF) is a non-destructive technique used to determine the elemental composition of a sample. During XRF analysis, a sample is bombarded with high-energy X-rays, causing the atoms within the sample to emit characteristic X-rays. The emitted X-rays are detected and analyzed to determine the types and amounts of elements present in the sample. XRF is widely used in fields such as material science, environmental analysis, and geology. Select

X-ray scattering is a non-destructive technique that provides information about the structure and properties of materials at the atomic or molecular level. It is based on the scattering of X-rays by the atoms or molecules within the material. By analyzing the diffraction pattern of the X-rays that have passed through the material, it is possible to determine information about its crystalline structure, crystal symmetry, and other properties. X-ray scattering is widely used in materials science, condensed matter physics, chemistry, and other fields. Select