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School of Chemical Engineering
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Battery Testing
Bioanalytics
Cameras
Chromatography
Electrochemical Equipment
Elemental Analysis
Furnaces and Ovens
High Pressure Equipment
Manufacturing
Measurement of Physical Properties
Mechanical Testing
Melt Processing
Microscopy
Other equipment
Particle Characterization
Reactor Systems
Separation/Grinding Techniques
Special Lab Spaces
Spectroscopy
Surface Properties
Thermal Characterization
Thin Film Characterization
Thin Film Deposition
Upstream and Downstream Processing
X-Ray Methods
X-Ray Diffraction
X-Ray Fluorescence
X-Ray Scattering
School of Chemical Engineering
X-Ray Methods
X-Ray Diffraction
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Key facts
Status
Available
Location
Kemistintie 1, 02150 Espoo, FINLAND
Room
B228a
Is training required?
Yes
Minimum reservation length
0,5 h
Maximum reservation length
120 h
Reservation change/cancellation limit
1 h
Contact information
Name
Email
Girish Tewari
girish.tewari@aalto.fi
Milla Vikberg
milla.vikberg@aalto.fi
Device information
Manufacturer
Bruker AXS SE
Model
Advance D8
Description
Bruker powder XRD equipped with XE-T detector.
Properties
Bragg-Brentano geometry
CuK_alpha X-ray source
Energy-dispersive monochromator
Automated beam knife for background filtering
Soller slits: 2.5° or 4.0°
Electrochemical cell for operando measurements
High-temperature furnace for in-situ analyses
An xyz sample stage for odd-shaped samples
ICDD database access
Advanced data analysis possibilities (e.g. TOPAS software)
Image(s)
Host unit
School of Chemical Engineering
Administrator contact info
Name
Email
Ilkka Välimaa
Ilkka.Valimaa@aalto.fi
Tags
XRD Powder diffraction
KT1-B228a
Capacity
1
Terms of use
Does this resource contain technology under export control?
Not defined
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