Atomic Force Microscopes

Atomic Force Microscopy (AFM) is a high-resolution imaging technique used to study the surface topography and properties of materials at the nanoscale. It employs a sharp probe or cantilever with a nanoscale tip that interacts with the sample surface, and by monitoring the deflection of the cantilever, it provides detailed information about surface features, roughness, mechanical properties, and even molecular interactions, making it a valuable tool in nanotechnology, materials science, and biological research.